Advantest H3-5068X03 Control Box Remote

For Characteristic Test for Transistor and FET

Synchronized operation of the two units of the 

6243/6244 allows characteristic test of a transistor or FET. 

Id and Ig can be measured simultaneously, as controlling the source 

timings of drain voltage and gate voltage to protect a device from stress.

● Linear, log and random sweep functions

● Pulse measurement with a minimum pulse of 1ms

● M e a s u r e m e n t d e l ay function for measurement timing control

● Source delay function for source timing control

For Battery Charge/Discharge Test

The 6243/6244 is available for battery charge and discharge test at 

constant current (CC) or constant voltage (CV) by DC or pulse application.

In a pulse charge and discharge test, measurement must be done at 

the time of and after the pulse application.

Using two units will allow measurement at the two points above and 

increase the current capacity up to 20A.

● Source sink current up to ±20A (7V)

● 20A (6244) and 4A (6243) by two-unit parallel operation

● Measurement at pulse HI/LO points

● Selectable from voltage measurement or current measurement

For DC/DC Converter Characteristic Test 

The following functions are effective for DC/DC converter characteristic test: 

● Parallel measurement of input current and output voltage/current  by using two units

● Electronic load capable of operation down to 0V (General electronic loads do not operate at 0.8V or less.)

● Large output current up to 10A (7V) (6244)

The 6243/6244 is a DC voltage and current source/monitor 

that offers wide ranging source and measurement as follows:

6243 Voltage: 0 to ±110V Current: 0 to ±2A

6244 Voltage: 0 to ±20V Current: 0 to ±10A

The 6243/6244 provides high accuracy with 4½-digit 

source resolution and 5½-digit measurement resolution, 

a variety of sweep functions, and a pulse measuring function with a minimum pulse width of 1ms. 

Thus, it can be used for a wide range of applications as a power source for 

evaluation in research and development of semiconductors 

and other electronic components or for characteristic test systems in a production line.

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