ENOTEC OXITEC® 5000+ O₂ Analyzer System

Measuring principle

The OXITEC® 5000 O₂ analyzer system consists of an InSitu probe

which is installed in a duct to measure non combustible process

gases and of an electronic unit for voltage and gas supply, as well

as for signal processing.

The oxygen sensor is at the tip of the probe and is regulated to

800 °C and works on the zirconium oxide principle of measurement.

Here, a mV signal between the reference gas side of the sensor

(inside, instrument air 20.95% O₂) and the measured gas side is

measured, which depends logarithmically on the ratio of oxygen

partial pressures on both sides of the sensor.

The mV signal is converted according to the Nernst equation into

oxygen partial pressure within the process gas, whereby the O₂

concentration is determined in the process gas. Gas-tight separation

of reference air and process gas is of particular importance.

Should combustible components such as CO or H₂ be present in the

sample gas, they will react with oxygen at the sensor surface and can

reduce the measured value.

Disruption of the process

The analyzer system has to be kept in operation also in the event of

the process being disrupted or if the plant is powered off temporarily

(e.g. at night or during the weekend).

Frequently cooling down and heating up of the probe results in thermal

stress of the hot probe parts (heater, thermocouple and sensor) and

reduces their product life. ENOTEC will not accept any responsibility for

resultant damage.

Storage instructions

ENOTEC equipment and spares are to be stored in a dry and ventilated

environment at temperatures between -40 °C to +80 °C (-40 °F to 176 °F).

Paint fumes, silicone sprays, etc. must be avoided in the storage environment.

Name plates

The name plate contains information about the line voltage, the nominated

current, frequency, protection class, year of manufacture, serial number, order

number and system order code.

The system order code refers to information which is detailed in the system

test report and supplied with the system.