Advantest digital multimeter ADCE 7351E-00JA

Brief Description

The Q8383 is an advanced spectrum analyzer (Advantest) with a two-pass monochromator and very low polarization dependence.

Thanks to a special method, values of ±0.05 dB are guaranteed, with typical values as low as 0.02 dB.

Together with the high accuracy of the resolution bandwidth, the Q8383 can be used to perform precise power measurements.

All of these features make the Q8383 an ideal measurement instrument for erbium-doped fiber amplifiers (EDFAs).

By simply comparing the signal at the input of the amplifier with the signal at the output of the amplifier, 

special measurement functions can be used to determine the noise figure, gain and spontaneous emission.

Of course, all these functions are also of great advantage when measuring laser diodes, light emitting diodes and other light sources.

The curve fitting function directly displays electroluminescence characteristics by fitting a Gaussian distribution to the emission spectrum.

This is very useful for measuring Erbium Doped Fiber Amplifiers (EDFA) and Light Emitting Diodes. 

A special feature for pulsed light allows measurements of fiber optic rings and soliton transport systems.

For DC/DC Converter Characteristic Test 

The following functions are effective for DC/DC converter characteristic test: 

● Parallel measurement of input current and output voltage/current  by using two units

● Electronic load capable of operation down to 0V (General electronic loads do not operate at 0.8V or less.)

● Large output current up to 10A (7V) (6244)

The 6243/6244 is a DC voltage and current source/monitor 

that offers wide ranging source and measurement as follows:

6243 Voltage: 0 to ±110V Current: 0 to ±2A

6244 Voltage: 0 to ±20V Current: 0 to ±10A

The 6243/6244 provides high accuracy with 4½-digit 

source resolution and 5½-digit measurement resolution, 

a variety of sweep functions, and a pulse measuring function with a minimum pulse width of 1ms. 

Thus, it can be used for a wide range of applications as a power source for 

evaluation in research and development of semiconductors 

and other electronic components or for characteristic test systems in a production line.

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