Advantest The T2000 supports concurrent test functionality

Time to Market Reduction - Multi-Session

The T2000 makes it possible to develop device test programs efficiently with minimal investment.

 With the multi-site CPU architecture unique to the T2000. multiple users can log in to a single

test system at the same time, and perform debugging work independently. Up to eight people

can work simultaneously, contributing to both engineering cost savings and TTM reduction.

In addition, eight people can develop separate functions for the same device concurrently,

which greatly shortens development times.

Best-In-Class Parallel Test Efficiency - Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction - Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Software

• Windows-based operating system.

• Rapid Development Kit (RDK) environment: allows easy coding, high code reusability, and fast and easy debugging.

• Versatile offline environment: T2000 System Software Emulator.

• Intuitive debug tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, Block Diagram Tool, etc.

• Reduces time to market: Test Condition Runtime Optimizer, Multi-session

SoC Test Solution

High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today's complex consumer devices.

Achieve feature-rich capabilities with high precision

In the ever-evolving digital consumer market, devices are becoming more sophisticated and diversified

in terms of functionality with:

• Multi-Time Domain functionality for testing several frequency domains simultaneously.

• 1.6GDME realizes low cost of test by high parallel testing.

• DSP192A module supports 96-ch device power supply by high density mounting.

• Analog module (GPWGD) full-spec test, covering high-performance audio to video.

• PMU32E module capable of handling a broad spectrum of precision test including ADC/DAC linearity.

• 8GDM corresponds to high-speed interface device testing.

Flexibly combined with these test modules, T2000 provides customers with an optimized test solution for consumer devices.