Advantest T2000 Flexible Platform Addresses Diverse Test Needs

Overview

Flexible Platform Addresses Diverse Test Needs

SoC devices require small-lot high-mix manufacturing methods in the present

era of rapid generation change. Semiconductor manufacturers struggle with

requirements to reconfigure a test system in a short time.

The T2000 platform adopts a module architecture and can be flexibly reconfigured

by rearranging the necessary functional modules according to the application.

A rich variety of functional modules, including digital, high-performance analog,

power-mixed signals, and image capture, provide a wide range of test coverage

and offer solutions at optimal cost. This makes it possible to have a scalable 

system configuration ranging from an air cooling system with 13 slots to a liquid

cooling system with 52 slots and up to 8.192 channels.

Advantest provides compact solutions with reduced initial investment for development

and small lot productions, and high-efficiency multiple-DUT parallel measurement

solutions for high volume manufacturing. The T2000 responds quickly to market

needs with minimal capital investment.

Features

While chipmakers enhance the functionality of semiconductor devices and increase

multi-functionality, they need to reduce development times.

Advantest's T2000 is ideal for testing these devices.

Time to Market Reduction - Multi-Session

The T2000 makes it possible to develop device test programs efficiently with minimal investment.

 With the multi-site CPU architecture unique to the T2000. multiple users can log in to a single

test system at the same time, and perform debugging work independently. Up to eight people

can work simultaneously, contributing to both engineering cost savings and TTM reduction.

In addition, eight people can develop separate functions for the same device concurrently,

which greatly shortens development times.

Best-In-Class Parallel Test Efficiency - Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction - Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.