Advantest The T2000 can measure multiple DUTs simultaneously

Setting a New Standard

• High flexibility and ease-of-use due to a multi-functional mixed-signal architecture.

• Low cost of test with high parallelism.

• Increased throughput with pattern-controlled test conditions.

• Enhanced test efficiency using per-channel time measurements.

• Simple load board Design by Cross function port and matrix functionality.

• Best-in-class performance, including fast range switching hardware, fast switching relays and

concurrent hardware operation.

• Simplified coding enabled by the rapid development kit (RDK) software package, which provides 

a user-friendly environment for developing reusable code and implementing fast debugging.

• Wide coverage for testing on the same platform, from low-voltage communication PMICs to

high-voltage automotive ASSPs.

CMOS Image Sensor Test Solution

We provide a test solution that minimizes test cost by flexibly supporting measurement of the newest

CMOS image sensors with leading-edge high-speed interfaces.

Flexible Support for Multifunctional Image Sensors

CMOS image sensors have a variety of built-in functions including AD/DA and logic circuits.

By combining measurement modules according to the functions required for testing specific

image sensors, the T2000 achieves a scalable system configuration.

High speed Image Capture up to 4.8Gbps

The T2000 image sensor test solution can capture the image output from CMOS image sensors utilized

in applications including smartphones, security cameras, and automotive/industrial cameras.

Its dual bank memory configuration minimizes test time by storing data and transferring it to the IP

engine at the same time.

Differential Input

• MIPI D-PHY V2.1：4.8Gbps

• MIPI C-PHY V1.2：3.5Gsps

• MIPI A-PHY®　*Option

Capture Memory：1.024M pixel x 2bank

• Available to continuously store max. 64.000 frames of the image data

Enhanced Image Processing Engine for Higher-Resolution Image Sensors

Advantest's new IPE4A (Image Processor Engine 4A) has achieved even faster high-speed image processing

compared to the previous IPE4. In conjunction with a specially developed image processing library,

it minimizes the increase in test time driven by ultra-high sensor resolution.

Maximum 64 DUT Parallel Test Capability Reduces Test Cost

The T2000 can measure multiple DUTs simultaneously, improving the productivity of image sensor chips

and lowering test costs. With a wide user area and a light source with an enlarged irradiation area,

it can perform parallel measurement of up to 64 DUTs.