Advantest T6391 Tester for Display Driver ICs

Test solution combines advanced capabilities with

high throughput for cost-efficient testing of DDIs

used in high-resolution LCDs

Integration trends are accelerating for the display driver ICs

(DDIs) that control the performance of high-resolution LCDs.

Today’s DDIs contain a large and growing number of logic/

analog circuits that manage high-level functions such as touch

sensor operations. At the same time, the expanding use of

LCDs in mobile electronics is driving market demand for smaller

DDI sizes and more capabilities. These factors raise serious

IC-testing challenges.  ADVANTEST’s T6391 system is designed

to address these needs as well as DDIs’ increasing number of

pins and faster interfaces.

Versatile and extendible

The T6391 achieves broad test coverage for all kinds of

applications including analog, memory and logic circuits with high

pin counts and high-speed interfaces. This versatility, enabled by

the system’s pin-card design, makes it the industry’s best test

solution for both engineering and production applications.

In addition to meeting customers’ current needs, the T6391 was

developed with future performance requirements in mind. It

is capable of testing PMIC functions embedded within DDIs, a

projected advancement in next-generation devices. To simplify

engineering efforts, the tester leverages the same TDL programming

environment as all other testers in ADVANTEST’s T6300 series.

Greater operating efficiency for high throughput

The T6391’s high-speed bus enables fast data transfer and calculation

for industry-leading throughput. With 512 I/O channels, it can handle

several devices in parallel. The system is designed for reliable, large

volume testing of high-resolution DDIs with up to 3.584 pins, as used

in full high-definition (HD), WXGA and HD720 displays.

A test solution for advanced ICs

To test DDIs that use MIPI (mobile industry process interface), the

standard protocol for mobile electronics, the T6391 can handle I/O

pin frequencies up to 1.6 Gbps. Using an additional measurement

module, the system can test the next-generation 6.5-Gbps interfaces

that are used in LCD drivers for ultra-high-definition televisions

including the 4K (2160p) generation.

Testing of analog ICs is facilitated by the T6391’s 16-channel arbitrary

waveform generator (AWG) and digital capture feature. Scan and memory

tests are enabled by scan pattern generator (SCPG), algorithmic pattern

generator (ALPG) and address fail memory (AFM) features.