Advantest M4841 Dynamic Test Handler

M4841

High-Throughput Device Handler

for Volume Production Testing of MCUs and DSPs

Today’s semiconductors are gain ing in complexity both in circuit

design and packaging, and continue to be challenged by high

volume applications that function in environments with wide-rang

ing temperature fluctuations.

Semiconductor test and handling equipment must evolve to meet

these requirements, in the same way it must adapt to increasing

demands for higher parallelism and higher throughput.

Unique in its class, ADVANTEST’s new M4841 Dynamic Test Handler

enables high-throughput parallel test for very high volumes of devices

and supports complex ICs and pack ages, including BGA, CSP and QFP.

Because of its advanced performance capabilities and features, the

M4841 is the optimal dynamic test handler for high volume production

of devices used in consumer products such as portable digital equipment

and automotive systems.

■Reduced Cost of Test

The M4841 is capable of parallel test of up to 32 devices, four times

capability of the earlier, industry-leading handler, also from ADVANTEST .

The M4841 also delivers a high throughput of 18.500 devices per hour.

With three times the throughput capacity of its predecessor, the M4841

sets a new standard for the industry.  Because of its high test efficiency,

the M4841 is well suited for high-volume production lines.

With its unprecedented combination of 16-device parallel test and 18.500

device-per-hour throughput at 3 seconds test time or less, the M4841

makes a substantial contribution to reduced cost of test.

■Supports Test Across Wide Temperature Range

The M4841 maintains a constant temperature and devices can be

cooled to -40̊C or heated to 125̊C.  This wide temperature range ensures

that the M4841 can be used to simulate device application environments

with severe temperature ranges, such as those experienced in automo-

tive or avionics. By minimizing the effects of heating or cooling upon

throughput, the M4841 offers consistently high speeds and performance,

even at extreme temperatures.

■Modular Structure

The M4841 is designed so that users can choose the best configuration for

their needs; the number of devices for paralleltest, test temperature range

and throughput.  Because of the variety of configurations available for the M4841.

users can optimize the M4841 to not only meet their test needs but also

optimize cost, for a very efficient as well as very high performing handler solution.