Advantest T5587 Memory Test System

A High Throughput Tester for Flexible Testing of Devices such as MCPs

As cell phones and notebook PCs become more compact and

yet incorporate ever more enhanced functionality, memory devices

have correspondingly increased in speed and in storage capacity.

Furthermore, the demand for stacked devices, such as DRAM + flash

devices and multi-chip packages (MCPs), has skyrocketed due to the

diversification of the end market usage. The T5587 is able to meet

this demand with its enhanced flash memory testing function and

high throughput, capable of a maximum testing rate of 400 Mbps

and simultaneously testing up to 512 devices.

Simultaneous Testing of Up to 512 Devices

The T5587 meets the higher throughput requirements of MCPs,

and achieves simulta neous testing of up to 512 devices.

Test Flash Memory Devices at High Speeds

The T5587 is capable of high-speed testing at 400 Mbps.

Furthermore, an enhanced bad block mask function and a newly

designed high-speed data transfer BUS enable this system to

drastically reduce the testing times for simulta neous testing of

NAND-type flash memory devices.

The Multi-language Operating System FutureSuite®

Use of the multi-language operating system FutureSuite allows

programming in the worldwide standard, C and ATL languages.