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Home ⊙ NEWS ⊙ Advantest Parallel Test Solution for Multiple Market Segments
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Advantest Parallel Test Solution for Multiple Market Segments

From:ADVANTEST | author:Mr.Chen | Time :2025-12-22 | 33 view: | Share:

ADVANTEST’s’ wide-range of optimally designed modules provides

flexible test solutions that can be tailored for all SoC device types.

Digital Consumer Test Solution

Expandability and Flexibility

Our 52-slot LS mainframe provides the lowest test cost for the

myriad of SoC devices and applications. Our modular architecture is

both flexible and expandable providing customers with the lowest

COT configuration for test requirement today and tomorrow.

Significant improvements in parallel test efficiency afford customers

a substantial test cost savings.

RF Test Solution

Independent quad-site RF resources (32 pin, VSG/VSA) achieve un

equalled levels of parallel test, and contribute significantly to a test

cost reduction for volume production.

Realize 70% test time reduction per DUT with multi-site efficiencies

greater than 85%

MCU Test Solution

Ideal coverage and broad functional ity for single-pass testing of MCU

devices with both embedded AD/DA, and Flash memory in a standard

T2000 configuration.

High-density channel resources and a newly developed pogo unit help

customers achieve massively parallel testing of MCU wafer probe devices.


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