Advantest V93000 Smart Scale™ Test Platform

Scalable platform combines the versatility to test

all types of semiconductor devices with “smart”

per-pin capabilities, enabling the industry’s most

cost-efficient test solutions

Reducing the cost of test requires not only innovative

technology, but also an extendable system architecture to

ensure long equipment lifetime for the greatest return on

customers’ capital investments.  ADVANTEST’s V93000

Smart Scale test platform is the semiconductor industry’s

first scalable, highly cost-efficient ATE solution to meet

these criteria, addressing the needs of leading IDMs,

foundries, design houses and OSATs around the world.

Solutions for Advanced CMOS

The V93000 Smart Scale generation is designed to meet

the challenges of testing advanced, high-integration CMOS

technology.  Increased test coverage, faster time-to-market

and superior test economics are achieved with industry

leading digital performance, high-speed I/O flexibility,

system-like stress testing, protocol-engine-per-pin™

capabilities, real-time memory emulation, SmartLoop™

testing of symmetrical high-speed interfaces and enhanced

SmarTest™ software functionality.

Smarter Testing

ADVANTEST’s V93000 Smart Scale generation incorporates

innovative per-pin testing capabilities.

Each pin can

run with its own clock domain to match the exact data

rate requirements of the device under test, providing full

test coverage.  In addition, the testers are equipped for

power supply modulation, jitter injection and protocol

communication

Application-specific Configurations

This versatile platform is available in various configurations,

each optimized to meet the customer’s distinct performance

and economic requirements:

•  The V93000 Versatile Digital solution addresses all

aspects of testing digital ICs, from wafer sorting to high-end

characterization.

•  For ICs for mobile applications, the V93000 Wireless/RF

solution can handle up to 96 ports with true octal-site and

high multi-site parallel efficiency at a minimal cost of test.

•  The V93000 SOC solution performs economic testing of

high-volume, cost-sensitive ICs while satisfying the testing

challenges of the latest mixed-signal devices used in

consumer electronics.

Scalable Tester Classes

Systems are available in four different classes – designated A,

C, S and L – featuring different test head sizes to provide the

most effective solution for each user’s specific applications.

These compatible tester classes allow users to quickly and

easily move their semiconductor devices from one Smart Scale

class to another as IC production volumes change over time.