T6373 Capable of 32 DUTs in Parallel Testing for 10-12 bit LCD Driver ICs
Global demand for LCD driver ICs is growing in response to an
expected sky rocketing in popularity for LCD televisions,
as well as liquid crystal panels for cellular phones with increasingly
rich feature sets. Tracking these developments, LCD driver ICs
are also growing in both pin count and function ality.
This evolution, however, has added to the importance of keeping
production costslow. The T6373 LCD driver test system offers an
optimal solution for customers facing this paradox.

Reducing Cost of Test for LCD Drivers with Large Pin Counts
The T6373 can be equipped with a maximum of 3.072 LCD channels
and 512 I/O channels. It supports four device parallel test for 640-pin
and 720-pin driver ICs, which will dominate in the future.
For driver ICs with BIST circuits, it could support up to 32 driver ICs.
Support for the Newest Driver ICs
The T6373’s high-speed/pre cision digitizer and DC (LCD ch) test
unitare configured for per-pin operation. When testing many-pin/precision
(10 bit/1024 gradation) driver ICs, this tester boasts throughput of up
to 150% greater than that of its predecessor.
Improved Support for Leveraging Legacy (T6372) Assets
By offering legacy support for the well-established test software, the
T6373 allows the customer to use valuable test assets, such as test
program environments, test boards, and probe cards,that supported
its predecessor model.
While preserving maximum compatibility with previous test systems,
the T6373 also allows the customer to minimize test costs.
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