Advantest Q8341 Optical Spectrum Analyzer

●High-speed, high-precision measurement LD

●High-speed measurement option: 0.5 s

●Narrow coherence measurement resolution: 0.001 mm

●Ten times higher wavelength accuracy: ±0.01 nm (option)

●High wavelength resolution option: 0.01 nm at 650 nm

Wide range of measurement wavelengths: 350 nm to 1000 nm

●Compact and lightweight platform

High throughput capability

The Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm.

The Q8341 utilizes a Fourier spectroscopy system with a Michelson interferometer so that coherence can be measured.

With a narrow wavelength resolution of 0.01 nm, the Q8341 is very effective in evaluating not only CD/DVD laser diodes, but also blue-violet laser diodes.

In addition, the built-in He-Ne laser serves as a wavelength reference, ensuring high wavelength measurement accuracy of ±0.01 nm.

Finally, the Q8341's fast measurement speed of 0.5 seconds* makes it ideal for evaluating the temperature characteristics of system components.

Coherent measurement resolution: 0.001 mm

● Wavelength resolution (650 nm):

0.05 nm (standard), 0.01 nm (option)

Peak wavelength measurement resolution of 0.001 nm

● Wavelength measurement accuracy:

±0.05 nm (standard), ±0.01 nm (option)

●Maximum input level: ±10 dBm

●Maximum coherence measurement length:

Approx. 10 mm (standard), Approx. 40 mm (option)

●Wavelength measurement range 350 to 1000 nm

●Small size and light weight

Measurement Principle

The Q8341 utilizes a Michelson interferometer. In this arrangement, light from the device under test is split into two paths (interference is generated between the two paths).

This produces an interferogram. The horizontal axis represents the difference in length (i.e., time or phase) of the two optical paths. And the vertical axis represents the intensity of the interfering light.

This is the autocorrelation of the device under test. FFT processing of this function yields the power spectrum. For this purpose, a He-Ne laser is used as a wavelength reference source.

Features

High-speed measurement option: 0.5 s.

Ideal for manufacturing/production environments The Q8341 can measure an entire span in approximately 0.5 seconds. This feature makes the Q8341 ideal for laser and LED production lines.

In addition, this fast measurement speed is ideal for high capacity environments.

Outstanding coherent analysis length

Analysis length Approx. 40 mm maximum (option)

Approx. 10 mm maximum (standard)

Maximum length resolution 0.001 mm

The Q8341 also evaluates the coherence of optical disk laser diodes. with an analysis length of up to 40 mm and a resolution as narrow as 0.001 mm, the Q8341 is ideally suited for evaluating blue-violet laser diodes and other compact optical components.

High wavelength accuracy

Wavelength accuracy: ±0.01 nm (optional), ±0.05 nm (standard)

The Q8341's built-in Ne-He laser reference light source enables spectral measurements with high wavelength accuracy.

Narrow-resolution measurement of the oscillation mode of a blue-violet laser diode

Wavelength resolution (at 650 nm):

0.01 nm (optional)

0.05 nm (standard)

The Q8341 has a narrow resolution that separates the oscillation modes of blue-violet laser diodes. In addition, the peak wavelength is measured with a resolution of 0.001 nm, making it ideal for monitoring measurement results affected by the DUT environment.

For high-throughput measurements

The Q8341 utilizes a large-capacity memory and a high-performance calculation unit to quickly store data. The calculation unit then performs calculations on this data to display the specified wavelength and span.

For example, if the Q8341 is to analyze spectra in two wavelength ranges (650 nm ±50 nm and 780 nm ±50 nm), it can perform spectral analysis of two different LDs by simply changing its display range.

All of this can be accomplished without reconfiguring the system. As a result, the Q8341 reduces the indexing time for mass production system use.