Advantest Q8326 Optical Wavelength Meter

Measures Optical Wavelength with High Accuracy of 2 ppm

and High Resolution of 0.001 nm.

● Fast sampling: Five measurements/sec.

● Frequency and deviation displays

Wavelength Meter Using He-Ne Laser as Reference Wavelength

The Q8326 is an optical wavelength meter that

measures an emission center wavelength with high resolution.

The Q8326 uses a He-Ne laser for the reference

wavelength and uses the Michelson interference

method to enable high accuracy measurement.

This wavelength meter achieves

fast sampling (five per second) which is optimum

for oscillation wavelength adjustment of

LD for DWDM. With the deviation display

function, wavelength fluctuations can also be

measured with high resolution and accuracy.

Applications

•Optimum for LD wavelength adjustment for DWDM due to

fast sampling measurement.

•Can be used as a wavelength standard for spectroscope calibration

due to high accuracy.

•Can be automated to measure the LD wavelength temperature

characteristics and wavelength current characteristics.

High Resolution

The Michelson interference method allows high resolution

measurements of up to 0.001 nm/100 MHz.

High Accuracy Measurements

Use of a He-Ne laser for the reference wavelength enables high

accuracy measurements of up to 2 ppm. In addition, since the

He-Ne laser oscillates with high stability, a 2 ppm measurement

accuracy is guaranteed over a long time period without recalibration.

Wide Bandwidth

The measurement range covers short wavelengths of 480 to

1000 nm and long wavelengths of 1000 to 1650 nm and is

selectable via a single switch operation.

High-speed Sampling

The Q8326 can measure wavelengths at a sampling speed of

five per second so that wavelength fluctuations caused by temperature

variations can be captured precisely.

Frequency and Deviation Displays

The Q8326 can not only display the wavelength but can also

be switched to display the frequency of the beam under measurement,

which is convenient for adjusting the oscillation

wavelength to the ITU-T grid. Since the deviation is displayed

using the keyed entry as the reference, wavelength fluctuations

of the LD caused by temperature variations can be viewed with

high resolution and high precision.

GPIB Provided as Standard

Standard provision of GPIB allows the Q8326 to be used as a

component for an automated measuring system utilizing fast sampling.