New tester delivers performance and speed
needed to test DDR4 and LPDDR4 memory ICs
used throughout portable electronics and servers
With today’s mobile electronic devices and the servers
that support them handling ever-increasing volumes
of data, semiconductor memory manufacturers need a
highly capable, cost-efficient means of testing their latest
generations of high-speed, high-capacity memory ICs –
including emerging DDR4-SDRAM and LPDDR4-SDRAM
chips. ADVANTEST’s T5503HS tester gives memory
manufacturers that industry-leading performance and a
low cost of test along with an upgradable system design.

High-speed test solution
ADVANTEST’s T5503HS system provides an optimal test
solution for double-data-rate SDRAMs and other next
generation memory chips. The tester can operate at speeds
up to 4.5 Gbps, fast enough to perform full-coverage testing
of the most advanced memories. In addition, the system
uses individual level settings, I/O dead-band canceling and
data-bus inversion (DBI) to maximize throughput in testing
high-speed devices.
To further enhance test performance, the T5503HS
automatically generates cyclic redundancy check (CRC) codes
and command/address (CA) parity codes to match the I/O
data rates and address of any DUT. This enables quick and
efficient development of new test programs, which reduces the
demands on customers’ resources while also improving the
time to market for new semiconductor designs.
Optimized for productivity
Capable of testing of up to 512 DDR4-SDRAM devices
in parallel, the T5503HS is a cost-effective, high-volume
test solution. The system’s real-time source-synchronous
function enables high throughput. Additionally, an advanced
timing-training capability helps to identify the most effective
test solution faster than other systems on the global market.
Together, these functions allow the T5503HS tester to achieve
much higher productivity than software-based systems.
Extendible lifetime
With its modular architecture, the T5503HS is designed to help
customers get the most value from their capital investments.
The system is available as a fully compatible upgrade on
ADVANTEST’s field-proven T5503 test platform. This enables
users to extend the performance of their existing testers while
also getting greater ROI as next-generation ICs are introduced.
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