ABB MB3000-CH90 Maintenance-free laboratory FT-IR gas analyzer Overview

The MB3000-CH90 gas analyzer provides fast and accurate FT-IR critical gas

measurements down to ppb levels in a user-friendly environment. 

Overview

This high performance and maintenance-free spectrometer is typically used in R&D or 

QA/QC laboratories for checking gas purity, controlling gas mixing and composition 

or performing unknown components speciation.

The heated gas cell can be easily swapped and replaced with other sampling accessories, 

making the MB3000-CH90 a flexible and versatile tool for any laboratory.

The MB3000-CH90 provides fast and accurate gas measurements in a user-friendly environment. 

The Horizon software enables the use of commercial or personalized spectral libraries for unknown

 gas identification and the heatable gas cell can be tuned for either long or short pathlength applications.

ABB‘s tight manufacturing tolerances and specifications for analyzer-to-analyzer matching permit 

laboratory development of calibrations which are routinely transferred to ABB process instruments.

Data

Typical applications of the MB3000-CH90 are found in both R&D and QA/QC laboratories,

for example checking gas purity, controlling gas mixing and composition or performing 

unknown components specification. The MB3000-CH90 is also used for fast off-line analysis 

of grab samples obtained from airborne or process gases.

This latest advancement in interferometer technology is extremely modular and compact and 

is combined with a patented 24-bit sampling algorithm for optimal dynamic range.

The permanently aligned optics with a Jacquinot stop in the interferometer output

beam ensure an accurate and stable line shape as well as wavelength and resolution stability.

As result, the MB3000-CH90 offers an outstanding spectroscopic performance enabling ppb level

gas analyzes with a standard DTGS detector. In addition, the analyzer can also be fitted with

an optional and hot-swappable liquid nitrogen-cooled MCT detector for applications requiring

higher sensitivity or measurement speed.