Advantest Q7750 Optical Oscilloscope (Optical Network Analyzer)

Optical Measuring Instruments and Optical Device Test Systems

Significant progress has been made in the research and development of ultra-high-speed

optical communications and high-density wavelength-division-multiplexed optical communications (Dense-WDM),

and these technologies are increasingly being used in industry.

In the field of research and development, amplitude characteristics, chromatic dispersion characteristics,

and group division multiplexing characteristics are of utmost importance,

In the R&D field, amplitude characteristics, chromatic dispersion characteristics and group 

delay characteristics of optical devices or optical subsystems need to be measured with high optical frequency resolution.

Devices that require this feature include AWGs, fiber grating filters, and dispersion compensators.

In particular, since dispersion characteristics can hinder the improvement of optical communication bit rates, dispersion values must be reduced or managed.

The Q7750 optocope (optical network analyzer) is a revolutionary device for measuring optical transmission characteristics.

It can measure the amplitude/dispersion/group delay characteristics of incident and

reflected light from optical devices at high speed and high resolution over the optical carrier frequency range.

In addition, it can easily measure various chromatic dispersion characteristics,

including the zero-dispersion characteristics and dispersion slope characteristics of dispersion-shifted or non-zero-dispersion fibers.

Measurement using the phase-shift method enables high optical frequency resolution and wide dynamic range.

Batch Measurement of Optical Transmission Characteristics in the Optical Carrier

Frequency Range The Q7750 is equipped with a variable wavelength light source.

The Q7750 is equipped with a variable wavelength light source that enables simultaneous

measurement of transmission and reflection characteristics in the optical carrier frequency

range by scanning a series of wavelengths (optical frequencies) (S21 and S11 as S-parameters).

The measurement parameters are shown in the table below. These parameters can be measured simultaneously in a single scan.