ADVANTEST V93000 EXA Scale - The New Generation

The Single Scalable Test Platform

In the age of IoT, 5G and artificial intelligence, more than half of all the microchips manufactured in the world are tested by our equipment. As the industry's leading manufacturer of automated test systems for semiconductor devices, we continuously revolutionize market standards and enable customers to shape their digital future.

Our V93000 platform addresses the latest industry challenges and enables applications like Artificial Intelligence (AI) & High-Performance Compute (HPC), medical devices, Advanced Driver Assistance Systems (ADAS), making the world safer, faster and our lives easier.

Thanks to the platform's scalability and compatibility over multiple generations, V93000 is future proof and saves cost. The all-in-one platform covers a variety of different solutions like RF, digital, power and analog.

Large Installed Base

Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high-volume manufacturing. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Outsourced IDMs and fabless companies find the V93000's test capacity installed in all major OSATs worldwide.

V93000 EXA Scale - The New Generation

The V93000 EXA Scale™ SoC Test Systems are targeted at advanced digital ICs up to the exascale performance class. The EXA Scale generation of the V93000 provides solutions that enable new test methodologies to meet the challenges of these advanced digital devices and deliver lower Cost-of-Test (CoT) and faster Time-to-Market (TTM).

Today's most advanced semiconductor processes allow for technology transformations that enable real-time integration of data from a countless number of sources such as IoT and handheld devices, automobiles and large servers to name a few. As mobile processors, Advanced Driver Assistance Systems (ADAS) processors, high-performance computing (HPC) and artificial intelligence (AI) ICs evolve, the amount of data being processed and the device power requirements continues to grow exponentially. Along with these advancements, new testing challenges, including exploding scan-data volumes, extreme power requirements, fast yield-learning, high pin-count, and high-multisite configurations need to be addressed. Advantest's new V93000 EXA Scale generation addresses these challenges with innovative advancements on the proven V93000 architecture.

The V93000 EXA Scale system employs Advantest's patented Xtreme Link technology, a communication network designed specifically for automatic test equipment (ATE). The technology provides high-speed data connections, embedded computing power, and instant card-to-card communication.

Advantages and Benefits

Platform scalability enables outstanding device portfolio coverage and provides CoT advantages in one single scalable test platform

The widest range of compatible tester configurations, that scale from small footprint engineering systems to very high pin count wafer sort and final test systems for high volume manufacturing (HVM),

The broadest application coverage in the industry, from High Performance Compute (HPC) & AI, to mobile & RF, to automotive & industrial.

Compatibility across tester generations maximizes test capacity utilization and investment protection of test hardware

Probe card and device-under-test (DUT) boards, and test programs can be utilized across V93000 generations to provide:

Fast qualification and transition to new capabilities

Flexibility to efficiently utilize available test capacity

Investment protection for test hardware (systems, instruments, probe cards and final test interface hardware) and test engineering infrastructure, knowledge and training

Integration technology leadership driving ATE Innovation through Moore’s Law

The innovative test processor-per-pin and environment friendly water-cooled architecture, which has endured over four generations of the V93000 is delivering industry leading pin density, reliability, and measurement stability & repeatability of digital, analog and RF instruments.